A FABRICATION OF 4H-SILICON CARBIDE BASED-LATERAL SCR FOR ESD PROTECTION DEVICE

Published 31 May 2019 •  vol 126  • 


Authors:

 

Kyoung-Il Do, Department of Electronics & Electrical Engineering, Dankook University, Korea
Tae-Ryong Park, Department of Computer Engineering, Seokyeong University, Korea/em>

Abstract:

 

This paper demonstrates a silicon carbide-based lateral silicon controlled rectifier (SCR) for use as an electrostatic discharge (ESD) protection device for high current ICs mounted on EVs or self-driving vehicles. The protection devices were designed with three split items and were fabricated with a line width of 0.5 µm. The protection devices were verified in terms of their electrical characteristics by using a transmission line pulse (TLP) system and a curve tracer. The measurements indicate that the devices have a trigger voltage of 165 V and a holding voltage of 40 V. The lateral SCR devices have a breakdown voltage (BV) of 82 V. In addition, the second breakdown current of the demonstrated SCR is above 18 A.

Keywords:

 

Electrostatic discharge (ESD) silicon carbide (SiC), silicon-controlled rectifier (SCR)

References:

 

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Citations:

 

APA:
Do, K.-I., & Park, T.-R. (2019). A Fabrication of 4H-Silicon Carbide based-Lateral SCR for ESD Protection Device. International Journal of Advanced Science and Technology (IJAST), ISSN: 2005-4238(Print); 2207-6360 (Online), NADIA, 126, 21-30. doi: 10.33832/ijast.2019.126.01.

MLA:
Do, Kyoung-Il, et al. “A Fabrication of 4H-Silicon Carbide based-Lateral SCR for ESD Protection Device.” International Journal of Advanced Science and Technology, ISSN: 2005-4238(Print); 2207-6360 (Online), NADIA, vol. 126, 2019, pp. 21-30. IJAST, http://article.nadiapub.com/IJAST/Vol126/3.html.

IEEE:
[1] K.-I. Do, and T.-R. Park, “A Fabrication of 4H-Silicon Carbide based-Lateral SCR for ESD Protection Device.” International Journal of Advanced Science and Technology (IJAST), ISSN: 2005-4238(Print); 2207-6360 (Online), NADIA, vol. 126, pp. 21-30, May 2019.